Study of High Current Testing on Electrical and Optical Characteristics of Light-Emitting Diodes

• Main Authors: Jian-kai Hong, 洪建愷
• Other Authors: Chun-Liang Lin
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/71101619620394521216

碩士 === 崑山科技大學 === 光電工程研究所 === 101 === Lifetime after packaging component testing industry would first erected before 1008 hours, its purpose is to look for the package after packaging components influence, this paper mainly increase the current acceleration component that 1008 hours on the package before the impact. In this study, use of ceramic leadframe and of molded method is encapsulated and packaged LED are mounted on a metal core and glass epoxy FR4 printed circuit board, at ambient temperature (25oC) and high temperature and high humidity (85oC / 85% RH) environment, In many current 1008 hours of continuous operation, with the operating time to detect the light output characteristics, and to determine the possible cause of failure. Experiments unknown high temperature and high humidity, Device operating in 500 mA 288 hours, light output suddenly dropped, and light output of 288 hours, rated current operation has been decayed to the extent of under 1008 hours, and its the LED forward voltage difference is only ± 0.2 (V), therefore increase the current blight of, can shorten the continuous operation at rated current consume at least 1,008 hours of time.