Study on Piezoresistive Properties and Low Frequency Noise Characteristics of Silicon Nanowire Transistors
碩士 === 正修科技大學 === 電子工程研究所 === 101 === Study on Piezoresistive Properties and Low Frequency Noise Characteristics of Silicon Nanowire Transistors Student: Tie-Chou Liang Advisor: Ting-Kuo Kang Department of Electronic Engineering Cheng Shiu University Kaohsiung County, Taiwan, Republic of China A...
Main Authors: | Tie-Chou Liang, 梁鐵籌 |
---|---|
Other Authors: | Ting-Kuo Kang |
Format: | Others |
Language: | zh-TW |
Published: |
2013
|
Online Access: | http://ndltd.ncl.edu.tw/handle/52159427403587199331 |
Similar Items
-
Characterization of the Piezoresistive Effects of Silicon Nanowires
by: Seohyeong Jang, et al.
Published: (2018-10-01) -
Low frequency noise measurement of silicon nanowire devices
by: Chia-Tze Huang, et al.
Published: (2006) -
Study on Piezoresistance and Thermoelectric Effects of Polycrystalline Silicon Nanowires
by: Kao,Tsung-Hsien, et al.
Published: (2012) -
The Study of Low Frequency Noise Characteristics of Polysilicon Thin-Film Transistors and Silicon-On-Insulators MOSFET's
by: Zhi-Hong Wu, et al.
Published: (2000) -
Low frequency noise in hydrogenated amorphous silicon thin-film transistors
by: Kim, Kang-Hyun
Published: (2006)