The Study of Thermal Behavior of Board Level with Copper Pillar to POP Package
碩士 === 中華大學 === 機械工程學系碩士班 === 101 === ABSTRACT The trend of electronic products today is moving toward further miniaturization, high functionality and improved performance. To accomplish this, new packaging needs to be able to integrate more dies with greater function, higher I/O counts, smaller pit...
Main Authors: | Lin Huai-Tse, 林懷擇 |
---|---|
Other Authors: | Chen Ching I |
Format: | Others |
Language: | zh-TW |
Published: |
2013
|
Online Access: | http://ndltd.ncl.edu.tw/handle/kt9623 |
Similar Items
-
The study of thermal-mechanical behavior with high copper pillar to POP package
by: SYU, WEI-JYUN, et al.
Published: (2012) -
Study of Package Copper Pillar Bump Electromigration and Failure Analysis
by: CHENG, KUAN-I, et al.
Published: (2017) -
The Analysis of the Thermal Characterization and Fatigue of Package-On-Package (POP) Assembly
by: Fu-TingWu, et al.
Published: (2011) -
POP IC Package Warpage Analysis
by: Ming-Tse Hung, et al.
Published: (2009) -
Mechanicals Behavior of Copper Pillar Bump
by: LAI,WEI-JUN, et al.
Published: (2014)