The Development of the Automatic Optical Identification for Large-area Graphene Films

碩士 === 國立中正大學 === 光機電整合工程研究所 === 101 === In this study, we established a rapid analysis system for few-layer graphene films. First, we create the database for different layers of graphene films spectral characteristics on SiO2(300nm)/Si substrate and the glass substrate, respectively. This database...

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Main Authors: Che-Ming Yang, 楊哲明
Other Authors: Hsiang-Chen Wang
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/10948719801948525326
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spelling ndltd-TW-101CCU006510072016-03-23T04:14:11Z http://ndltd.ncl.edu.tw/handle/10948719801948525326 The Development of the Automatic Optical Identification for Large-area Graphene Films 大面積石墨烯薄膜自動化光學檢測技術之開發 Che-Ming Yang 楊哲明 碩士 國立中正大學 光機電整合工程研究所 101 In this study, we established a rapid analysis system for few-layer graphene films. First, we create the database for different layers of graphene films spectral characteristics on SiO2(300nm)/Si substrate and the glass substrate, respectively. This database was created by the image capture system (ICS) and multi-spectral imaging technology. Finally, we use principal component score plot to create a database to determine different layers on different substrates. When the unknown sample need to identify, we will enter it into database to analysis. Finally, we use different colors to mark the position of different layers. In this study, we analysis and marked graphene layers on the SiO2(300nm) / Si substrate and the glass substrate, successfully. Hsiang-Chen Wang 王祥辰 2013 學位論文 ; thesis 70 zh-TW
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language zh-TW
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description 碩士 === 國立中正大學 === 光機電整合工程研究所 === 101 === In this study, we established a rapid analysis system for few-layer graphene films. First, we create the database for different layers of graphene films spectral characteristics on SiO2(300nm)/Si substrate and the glass substrate, respectively. This database was created by the image capture system (ICS) and multi-spectral imaging technology. Finally, we use principal component score plot to create a database to determine different layers on different substrates. When the unknown sample need to identify, we will enter it into database to analysis. Finally, we use different colors to mark the position of different layers. In this study, we analysis and marked graphene layers on the SiO2(300nm) / Si substrate and the glass substrate, successfully.
author2 Hsiang-Chen Wang
author_facet Hsiang-Chen Wang
Che-Ming Yang
楊哲明
author Che-Ming Yang
楊哲明
spellingShingle Che-Ming Yang
楊哲明
The Development of the Automatic Optical Identification for Large-area Graphene Films
author_sort Che-Ming Yang
title The Development of the Automatic Optical Identification for Large-area Graphene Films
title_short The Development of the Automatic Optical Identification for Large-area Graphene Films
title_full The Development of the Automatic Optical Identification for Large-area Graphene Films
title_fullStr The Development of the Automatic Optical Identification for Large-area Graphene Films
title_full_unstemmed The Development of the Automatic Optical Identification for Large-area Graphene Films
title_sort development of the automatic optical identification for large-area graphene films
publishDate 2013
url http://ndltd.ncl.edu.tw/handle/10948719801948525326
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