| Summary: | 碩士 === 淡江大學 === 電機工程學系碩士在職專班 === 100 === One of IC tester’s problems is the larger and larger test data volume due to the complexity of the circuit design. Furthermore, since the unknown generated during the test procedure is taking a major part of the test data volume and space, it has become a waste of time and a burden, affecting rate of data compact.
In this study, we combine clustering-approach with filling in X to substitute the unknown. By doing so, we solve the problem of the unknown and thus upgrade the compression rate. Take our case as an example, we first classify the clusters into groups and fill in a fixed number when cluster number equals 2. The outcome is a higher compression rate and no loss of data.
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