Non-Scanning Non-Interferometric Intensity-Type Three-Dimensional Optical Profilometers and Microscopes
博士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 100 === The essence of study is based on the reflectivity-to-height transformation and using the CCD imaging technique to build up a new three-dimensional profilometer or microscope. According to the basic geometrical optics, the test ray angle on the test surface...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/52uq5d |