Automatic Inspection of Solar Cell Defects and Its Parallel Processing Implementation in Graphic Card

• Main Authors: Chih-Hsien Huang, 黃志賢
• Other Authors: 林武杰
• Format: Others
• Language: zh-TW
• Published: 2012
• Online Access: http://ndltd.ncl.edu.tw/handle/xdnk26

碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 100 === Solar energy technology is one of the most important areas in these years. Many countries put plentiful resources and budgets in this industry. Lots of companies in Taiwan devoted to this area as well, and thus shaped a solar energy industry chain. Since most Taiwan companies in this industry focus on mass production, quality control is thus an important task for these companies. Lots of inspection tasks are included in the quality control process, we propose a system which automatically detects surface and internal defects in solar cell. The surface defect inspection system uses a CCD camera to take images of solar cells, recognizes fingers on the surfaces, and identifies defect positions. Experimental results show that defects such as Stains, spots, scratches, white spots, bad wiring, and breaks in fingers, are successfully detected by the proposed system. On inspecting internal defects, we propose to apply bias flow to the solar cell, captures emissions of solar cell, and processes captured image to recognize the internal defects in the solar cell. The experimental results show that the proposed system can successfully detect internal defects which can not be found by visual inspection.To further increase the inspection speed, we proposed parallel processing algorithms and implement them in graphic card. Experimental results show that the inspection speed is successfully increased by using parallel processing algorithms.