Material Properties of GaAsPSb
碩士 === 國立臺灣大學 === 電子工程學研究所 === 100 === In this thesis, we use secondary ion mass spectroscopy to acquire mole fractions of our samples; Using high resolution X-ray diffraction to do the reciprocal space mapping, and obtain the information about lattice structure; Using Extended X-ray absorption fine...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2012
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Online Access: | http://ndltd.ncl.edu.tw/handle/99097800891086977924 |