Material Properties of GaAsPSb

碩士 === 國立臺灣大學 === 電子工程學研究所 === 100 === In this thesis, we use secondary ion mass spectroscopy to acquire mole fractions of our samples; Using high resolution X-ray diffraction to do the reciprocal space mapping, and obtain the information about lattice structure; Using Extended X-ray absorption fine...

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Bibliographic Details
Main Authors: Han-Sheng Tsai, 蔡漢聲
Other Authors: 林浩雄
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/99097800891086977924