PVT Co-Monitoring Methodology for Integrated Circuits

碩士 === 國立清華大學 === 電機工程學系 === 100 === The ring oscillator has long been used as a process monitor inside an IC. However, its clock period is jointly affected by the PVT (Process, Voltage, and Temperature) conditions. In this work, we present a low-cost methodology that can make a ring oscillator an e...

Full description

Bibliographic Details
Main Authors:	Tseng, Tzu-Yen, 曾梓晏
Other Authors:	Huang, Shi-Yu
Format:	Others
Language:	en_US
Published:	2011
Online Access:	http://ndltd.ncl.edu.tw/handle/16602708216974007930

id	ndltd-TW-100NTHU5442004
record_format	oai_dc
spelling	ndltd-TW-100NTHU54420042015-10-13T20:51:34Z http://ndltd.ncl.edu.tw/handle/16602708216974007930 PVT Co-Monitoring Methodology for Integrated Circuits 用於積體電路之製程變動、電壓落差及溫度共同監測方法 Tseng, Tzu-Yen 曾梓晏碩士國立清華大學電機工程學系 100 The ring oscillator has long been used as a process monitor inside an IC. However, its clock period is jointly affected by the PVT (Process, Voltage, and Temperature) conditions. In this work, we present a low-cost methodology that can make a ring oscillator an even more versatile monitor – for not only the process status, but also the temperature and the IR-drop traces in normal operation. To achieve this goal, our methodology heavily relies on the support of the software to perform two tasks - (1) PVT-aware clock period modeling of a given ring oscillator, and (2) PVT analysis that derives the temperature trace and the IR-drop trace inside an IC under monitoring considering process variation. Huang, Shi-Yu 黃錫瑜 2011 學位論文 ; thesis 39 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立清華大學 === 電機工程學系 === 100 === The ring oscillator has long been used as a process monitor inside an IC. However, its clock period is jointly affected by the PVT (Process, Voltage, and Temperature) conditions. In this work, we present a low-cost methodology that can make a ring oscillator an even more versatile monitor – for not only the process status, but also the temperature and the IR-drop traces in normal operation. To achieve this goal, our methodology heavily relies on the support of the software to perform two tasks - (1) PVT-aware clock period modeling of a given ring oscillator, and (2) PVT analysis that derives the temperature trace and the IR-drop trace inside an IC under monitoring considering process variation.
author2	Huang, Shi-Yu
author_facet	Huang, Shi-Yu Tseng, Tzu-Yen 曾梓晏
author	Tseng, Tzu-Yen 曾梓晏
spellingShingle	Tseng, Tzu-Yen 曾梓晏 PVT Co-Monitoring Methodology for Integrated Circuits
author_sort	Tseng, Tzu-Yen
title	PVT Co-Monitoring Methodology for Integrated Circuits
title_short	PVT Co-Monitoring Methodology for Integrated Circuits
title_full	PVT Co-Monitoring Methodology for Integrated Circuits
title_fullStr	PVT Co-Monitoring Methodology for Integrated Circuits
title_full_unstemmed	PVT Co-Monitoring Methodology for Integrated Circuits
title_sort	pvt co-monitoring methodology for integrated circuits
publishDate	2011
url	http://ndltd.ncl.edu.tw/handle/16602708216974007930
work_keys_str_mv	AT tsengtzuyen pvtcomonitoringmethodologyforintegratedcircuits AT céngzǐyàn pvtcomonitoringmethodologyforintegratedcircuits AT tsengtzuyen yòngyújītǐdiànlùzhīzhìchéngbiàndòngdiànyāluòchàjíwēndùgòngtóngjiāncèfāngfǎ AT céngzǐyàn yòngyújītǐdiànlùzhīzhìchéngbiàndòngdiànyāluòchàjíwēndùgòngtóngjiāncèfāngfǎ
_version_	1718052056573411328

PVT Co-Monitoring Methodology for Integrated Circuits

Similar Items