Optimal Sample Size Allocation for Accelerated Degradation Test (based on Exponential Dispersion Model andV-optimality Criterion)
碩士 === 國立清華大學 === 統計學研究所 === 100 === Accelerated degradation test (ADT) is widely used to assess the lifetime information (e.g.,p-thquantileor mean-time-to-failure (MTTF))of highly reliable products. Hence,it is a challenging issue for reliabilityengineer to plan an efficientADT test. Recently, Lee...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/18501934393076313934 |