Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire

博士 === 國立清華大學 === 物理系 === 100 === This work aims to study the diffraction pattern and dynamical analysis of asymmetric surface diffraction from a nano-structure on a chip. This studying is able to design a wide-angle incidence x-ray optical device using crystal surface diffraction. We have investiga...

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Main Authors: Chen, Hsin-Yi, 陳心誼
Other Authors: Chang, Shih-Lin
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/00578038992132928618
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spelling ndltd-TW-100NTHU51980342015-10-13T21:23:06Z http://ndltd.ncl.edu.tw/handle/00578038992132928618 Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire X光廣角入射矽奈米線之表面繞射圖譜與動力繞射分析 Chen, Hsin-Yi 陳心誼 博士 國立清華大學 物理系 100 This work aims to study the diffraction pattern and dynamical analysis of asymmetric surface diffraction from a nano-structure on a chip. This studying is able to design a wide-angle incidence x-ray optical device using crystal surface diffraction. We have investigated the possibility of the opical device. Nano-structures were prepared on a 6-in Si (001) wafer. The Si (113) is chosen as an asymmetric surface diffraction for the photon energy 8.8785 keV according to the Si crystal orientation and diffraction geometry. The experimental results may be summarized as follows. First, there are two diffraction peaks in vertical direction for bare silicon, which are diffracted beam Si (113) and specular reflection of Si (113). The experimental results are in good agreement with the theoretical calculations using the dynamical theory of x-ray diffraction. Second, four peaks were measured in vertical direction for silicon nano-wire. Two of peaks were from bare silicon due to width of silicon nano-wire is much smaller than incident beam spot in horizontal direction. The other two peaks due to a silicon nano-wire and its specular reflection. The ray tracing of a silicon nano-wire was drawn. Finally, the schematic design of wide-angle incidence x-ray waveguide is Au/Si/Au sandwich system with Si as the guiding layer and Au as cladding layer. The surface diffracted beam can be confined and propgated inside the silicon nano-wire if the total refection occurs. In additional, I have introduced an algorithm, Diffraction Pattern Algorithm, to get the diffraction patter. The correlation between excitation of mode inside the crystal and diffraction pattern outside the crystal can be illustrated by experimental data and theoretical calculation using the algorithm. Keyword: asymmetric surface diffracted beam, the dynamical theory of x-ray diffraction, wide-angle incidence x-ray waveguide Chang, Shih-Lin 張石麟 2012 學位論文 ; thesis 89 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 博士 === 國立清華大學 === 物理系 === 100 === This work aims to study the diffraction pattern and dynamical analysis of asymmetric surface diffraction from a nano-structure on a chip. This studying is able to design a wide-angle incidence x-ray optical device using crystal surface diffraction. We have investigated the possibility of the opical device. Nano-structures were prepared on a 6-in Si (001) wafer. The Si (113) is chosen as an asymmetric surface diffraction for the photon energy 8.8785 keV according to the Si crystal orientation and diffraction geometry. The experimental results may be summarized as follows. First, there are two diffraction peaks in vertical direction for bare silicon, which are diffracted beam Si (113) and specular reflection of Si (113). The experimental results are in good agreement with the theoretical calculations using the dynamical theory of x-ray diffraction. Second, four peaks were measured in vertical direction for silicon nano-wire. Two of peaks were from bare silicon due to width of silicon nano-wire is much smaller than incident beam spot in horizontal direction. The other two peaks due to a silicon nano-wire and its specular reflection. The ray tracing of a silicon nano-wire was drawn. Finally, the schematic design of wide-angle incidence x-ray waveguide is Au/Si/Au sandwich system with Si as the guiding layer and Au as cladding layer. The surface diffracted beam can be confined and propgated inside the silicon nano-wire if the total refection occurs. In additional, I have introduced an algorithm, Diffraction Pattern Algorithm, to get the diffraction patter. The correlation between excitation of mode inside the crystal and diffraction pattern outside the crystal can be illustrated by experimental data and theoretical calculation using the algorithm. Keyword: asymmetric surface diffracted beam, the dynamical theory of x-ray diffraction, wide-angle incidence x-ray waveguide
author2 Chang, Shih-Lin
author_facet Chang, Shih-Lin
Chen, Hsin-Yi
陳心誼
author Chen, Hsin-Yi
陳心誼
spellingShingle Chen, Hsin-Yi
陳心誼
Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire
author_sort Chen, Hsin-Yi
title Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire
title_short Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire
title_full Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire
title_fullStr Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire
title_full_unstemmed Diffraction Pattern and Dynamical Analysis of Wide-Angle Incident X-ray Surface Diffraction from Silicon Nano-Wire
title_sort diffraction pattern and dynamical analysis of wide-angle incident x-ray surface diffraction from silicon nano-wire
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/00578038992132928618
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