Investigation of Switching Mechanisms and Device Measurements from a ZnO Thin Film Resistive Switching Memory

碩士 === 國立清華大學 === 材料科學工程學系 === 100 === The thesis has successfully presented a method of transformation of the filamentary resistive switching into the homogeneous interface resistive switching in a Pt/ZnO thin films/Pt memory device. Two types of switching behaviors, which exhibit different re...

Full description

Bibliographic Details
Main Authors: Huang, Chi-Hsin, 黃棨歆
Other Authors: Chueh, Yu-Lun
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/52256870639742858633