Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method

碩士 === 國立屏東科技大學 === 工業管理系所 === 100 === Multi-layer ceramic capacitors (MLCC) are widely utilized as an important part in various electric and electronic units. In general, the consumption of electrics such as mobile phones and digital TVs consist of at least 150 pieces of MLCC whose each manufacturi...

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Main Authors: Chin-Hung Lin, 林晉宏
Other Authors: Tai-Sheng Su
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/28687183024419144495
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spelling ndltd-TW-100NPUS50410472016-12-22T04:18:34Z http://ndltd.ncl.edu.tw/handle/28687183024419144495 Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method 應用田口方法品質分析於積層陶瓷電容器之外觀檢驗 Chin-Hung Lin 林晉宏 碩士 國立屏東科技大學 工業管理系所 100 Multi-layer ceramic capacitors (MLCC) are widely utilized as an important part in various electric and electronic units. In general, the consumption of electrics such as mobile phones and digital TVs consist of at least 150 pieces of MLCC whose each manufacturing batch contains considerable amount to millions pieces. The pieces of MLCC are inspected from visual inspection machines to replace manual visual inspection. In order to improve the quality of visual inspection the Taguchi method is used to formulate the experimental layout via five pivotal parameters which are extracted from practical processes of manufacturing. Through this study, not only can the optimal parameter design for visual inspection machines of MLCC be determined, but also significant parameters that affect the quality of visual inspection of the MLCC can be obtained. Experimental results are provided to illustrate the effectiveness of this approach. Keywords: multi-layer ceramic capacitors; parameter design; Taguchi method; visual inspection. Tai-Sheng Su 蘇泰盛 2012 學位論文 ; thesis 62 zh-TW
collection NDLTD
language zh-TW
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sources NDLTD
description 碩士 === 國立屏東科技大學 === 工業管理系所 === 100 === Multi-layer ceramic capacitors (MLCC) are widely utilized as an important part in various electric and electronic units. In general, the consumption of electrics such as mobile phones and digital TVs consist of at least 150 pieces of MLCC whose each manufacturing batch contains considerable amount to millions pieces. The pieces of MLCC are inspected from visual inspection machines to replace manual visual inspection. In order to improve the quality of visual inspection the Taguchi method is used to formulate the experimental layout via five pivotal parameters which are extracted from practical processes of manufacturing. Through this study, not only can the optimal parameter design for visual inspection machines of MLCC be determined, but also significant parameters that affect the quality of visual inspection of the MLCC can be obtained. Experimental results are provided to illustrate the effectiveness of this approach. Keywords: multi-layer ceramic capacitors; parameter design; Taguchi method; visual inspection.
author2 Tai-Sheng Su
author_facet Tai-Sheng Su
Chin-Hung Lin
林晉宏
author Chin-Hung Lin
林晉宏
spellingShingle Chin-Hung Lin
林晉宏
Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method
author_sort Chin-Hung Lin
title Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method
title_short Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method
title_full Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method
title_fullStr Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method
title_full_unstemmed Quality Analysis of Visual Inspection for Multi-Layer Ceramic Capacitor using the Taguchi Method
title_sort quality analysis of visual inspection for multi-layer ceramic capacitor using the taguchi method
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/28687183024419144495
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