Study of the Durability Testing System for Motherboard On-Off Switching Numbers

• Main Authors: Chun-Hsuan Shih, 施俊炫
• Other Authors: Chau-Shing Wang
• Format: Others
• Language: zh-TW
• Published: 2012
• Online Access: http://ndltd.ncl.edu.tw/handle/37161817071462571732

碩士 === 國立彰化師範大學 === 電機工程學系 === 100 === This study aims to develop a durability test system for motherboard on-off testing. The test system mainly utilizes a single-chip microcontroller, some digital logical circuits, which serves as the input and output control, timer, counter, display, record, and driver functions. The system is also supplemented with the power and the system on-off control circuit to achieve a low-cost test system which is easy to build. The system can provide motherboard developers with experimental data and testing results to ensure that motherboard products can undergo on-off cycles to a certain standard. The results show that the durability test system for motherboard on-off testing can be effectively applied for development, verification, and test for mass-production in motherboard design.