Evaluation of Diffusion Barrier between Pure Tin and Tellurium

碩士 === 國立中央大學 === 化學工程與材料工程研究所 === 100 === To simplify the element of bismuth telluride thermoelectric materials, the experiments reported in this study used Te as the substrate to evaluate the capability of Ni as a diffusion barrier. Ni-P or Ni-P/Co-P was coated on Te by electroless plating and the...

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Bibliographic Details
Main Authors: Chang-Yen Ko, 柯昌延
Other Authors: Albert T. Wu
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/48688173089208741701