Improvement of True/False Defects Detection Using Diffuse Reflection Inspection System in the Cell Process of LCD
碩士 === 國立交通大學 === 平面顯示技術碩士學位學程 === 100 === In this research, we will improve the overkill which is the particles in the environment fall on the panel , and make Cell test AOI judgment be not correct in the LCD Cell process .And the senseless overkill will make panel repair and waste machine manufact...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/00545852688024653575 |