Multiple Incident Angles in Imaging Ellipsometry and its Application in Measuring Surface Plasmon Resonance
碩士 === 國立交通大學 === 光電工程學系 === 100 === This work presents the application of polarizer—sample—analyzer (PSA) imaging ellipsometer in measuring the ellipsometric parameters under the surface plasmon resonance (SPR) configuration. By using cylindrical lens to produce multiple incident angles, one ca...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/06677208447484950919 |