Measuring In-plane Resonance for Crystalline Silicon Wafer Using Electronic Speckle Pattern Interferometry Method
碩士 === 國立交通大學 === 機械工程學系 === 100 === The crystalline silicon wafers of commercial 6-in photovoltaic cells have the thickness as thin as 200 ?慆. They have both good flexibility and brittle material property. The in-plane resonance in a thin plate has sparse modal density and can be potentially used t...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/09939016849497467345 |