Design of Puncture Patterns for Rate-Compatible LDPC Codes

碩士 === 國立交通大學 === 電信工程研究所 === 100 === In this thesis, we study puncturing schemes for finite-length rate-compatible lowdensity parity-check codes. A new bit-by-bit puncturing pattern searching scheme is proposed. The ultimate goal of the proposed method is to improve the recovery error probability o...

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Main Author: 劉殷呈
Other Authors: Su, Y. T.
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/14457981580713195502
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spelling ndltd-TW-100NCTU54351342015-10-13T21:45:18Z http://ndltd.ncl.edu.tw/handle/14457981580713195502 Design of Puncture Patterns for Rate-Compatible LDPC Codes 穿刺位元的設計針對碼率相容的低密度檢測碼 劉殷呈 碩士 國立交通大學 電信工程研究所 100 In this thesis, we study puncturing schemes for finite-length rate-compatible lowdensity parity-check codes. A new bit-by-bit puncturing pattern searching scheme is proposed. The ultimate goal of the proposed method is to improve the recovery error probability of the punctured bits. We also take into account the detrimental effects on previous punctured and unpunctured bits brought about by the new selected punctured. Given the bit locations which have been punctured, a new one is chosen from the set of candidate bits by i) examining its recovery capability (which depends on the number and reliabilities of its connected check node message) and ii) assessing the impact a candidate bit may make. Numerical experimental results show that the proposed scheme outperforms existing puncturing methods. The superiority and robustness of our scheme are further verified by some observed statistics and are consistent with a Gaussian approximation based analytic prediction. Su, Y. T. 蘇育德 2012 學位論文 ; thesis 53 en_US
collection NDLTD
language en_US
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description 碩士 === 國立交通大學 === 電信工程研究所 === 100 === In this thesis, we study puncturing schemes for finite-length rate-compatible lowdensity parity-check codes. A new bit-by-bit puncturing pattern searching scheme is proposed. The ultimate goal of the proposed method is to improve the recovery error probability of the punctured bits. We also take into account the detrimental effects on previous punctured and unpunctured bits brought about by the new selected punctured. Given the bit locations which have been punctured, a new one is chosen from the set of candidate bits by i) examining its recovery capability (which depends on the number and reliabilities of its connected check node message) and ii) assessing the impact a candidate bit may make. Numerical experimental results show that the proposed scheme outperforms existing puncturing methods. The superiority and robustness of our scheme are further verified by some observed statistics and are consistent with a Gaussian approximation based analytic prediction.
author2 Su, Y. T.
author_facet Su, Y. T.
劉殷呈
author 劉殷呈
spellingShingle 劉殷呈
Design of Puncture Patterns for Rate-Compatible LDPC Codes
author_sort 劉殷呈
title Design of Puncture Patterns for Rate-Compatible LDPC Codes
title_short Design of Puncture Patterns for Rate-Compatible LDPC Codes
title_full Design of Puncture Patterns for Rate-Compatible LDPC Codes
title_fullStr Design of Puncture Patterns for Rate-Compatible LDPC Codes
title_full_unstemmed Design of Puncture Patterns for Rate-Compatible LDPC Codes
title_sort design of puncture patterns for rate-compatible ldpc codes
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/14457981580713195502
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