Design of Puncture Patterns for Rate-Compatible LDPC Codes
碩士 === 國立交通大學 === 電信工程研究所 === 100 === In this thesis, we study puncturing schemes for finite-length rate-compatible lowdensity parity-check codes. A new bit-by-bit puncturing pattern searching scheme is proposed. The ultimate goal of the proposed method is to improve the recovery error probability o...
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ndltd-TW-100NCTU54351342015-10-13T21:45:18Z http://ndltd.ncl.edu.tw/handle/14457981580713195502 Design of Puncture Patterns for Rate-Compatible LDPC Codes 穿刺位元的設計針對碼率相容的低密度檢測碼 劉殷呈 碩士 國立交通大學 電信工程研究所 100 In this thesis, we study puncturing schemes for finite-length rate-compatible lowdensity parity-check codes. A new bit-by-bit puncturing pattern searching scheme is proposed. The ultimate goal of the proposed method is to improve the recovery error probability of the punctured bits. We also take into account the detrimental effects on previous punctured and unpunctured bits brought about by the new selected punctured. Given the bit locations which have been punctured, a new one is chosen from the set of candidate bits by i) examining its recovery capability (which depends on the number and reliabilities of its connected check node message) and ii) assessing the impact a candidate bit may make. Numerical experimental results show that the proposed scheme outperforms existing puncturing methods. The superiority and robustness of our scheme are further verified by some observed statistics and are consistent with a Gaussian approximation based analytic prediction. Su, Y. T. 蘇育德 2012 學位論文 ; thesis 53 en_US |
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碩士 === 國立交通大學 === 電信工程研究所 === 100 === In this thesis, we study puncturing schemes for finite-length rate-compatible lowdensity
parity-check codes. A new bit-by-bit puncturing pattern searching scheme is
proposed. The ultimate goal of the proposed method is to improve the recovery error
probability of the punctured bits. We also take into account the detrimental effects
on previous punctured and unpunctured bits brought about by the new selected punctured.
Given the bit locations which have been punctured, a new one is chosen from
the set of candidate bits by i) examining its recovery capability (which depends on the
number and reliabilities of its connected check node message) and ii) assessing the impact
a candidate bit may make. Numerical experimental results show that the proposed
scheme outperforms existing puncturing methods. The superiority and robustness of
our scheme are further verified by some observed statistics and are consistent with a
Gaussian approximation based analytic prediction.
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Su, Y. T. |
author_facet |
Su, Y. T. 劉殷呈 |
author |
劉殷呈 |
spellingShingle |
劉殷呈 Design of Puncture Patterns for Rate-Compatible LDPC Codes |
author_sort |
劉殷呈 |
title |
Design of Puncture Patterns for Rate-Compatible LDPC Codes |
title_short |
Design of Puncture Patterns for Rate-Compatible LDPC Codes |
title_full |
Design of Puncture Patterns for Rate-Compatible LDPC Codes |
title_fullStr |
Design of Puncture Patterns for Rate-Compatible LDPC Codes |
title_full_unstemmed |
Design of Puncture Patterns for Rate-Compatible LDPC Codes |
title_sort |
design of puncture patterns for rate-compatible ldpc codes |
publishDate |
2012 |
url |
http://ndltd.ncl.edu.tw/handle/14457981580713195502 |
work_keys_str_mv |
AT liúyīnchéng designofpuncturepatternsforratecompatibleldpccodes AT liúyīnchéng chuāncìwèiyuándeshèjìzhēnduìmǎlǜxiāngróngdedīmìdùjiǎncèmǎ |
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