A Theoretic Study on Three Low-Density Parity-Check and BCH Concatenated Coding Schemes

碩士 === 國立交通大學 === 電信工程研究所 === 100 === Bose-Chaudhuri-Hocquenghem (BCH) codes have been widely used in flash memories for many years. Yet, in future “high-density” multi-level cell (MLC) flash memories, the raw bit-error-rate (BER) in NAND flash may increase up to around 10−2 at its life time, and...

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Bibliographic Details
Main Authors: Huang, Po-Yuan, 黃柏元
Other Authors: Chen, Po-Ning
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/37821241941837457230