Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates

碩士 === 國立交通大學 === 電子研究所 === 100 === In this thesis, the device quality of InGaN light-emitting diodes (LEDs) is investigated by studying their low-frequency noise characteristics. We firstly measurethe electrical noisespectra of LEDs under different current injection. Then the individual spectrum is...

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Main Authors: Kuan, Chin-I, 管金儀
Other Authors: Lin, Gray
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/93101905775992309531
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spelling ndltd-TW-100NCTU54281592016-03-28T04:20:37Z http://ndltd.ncl.edu.tw/handle/93101905775992309531 Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates 圖案化藍寶石基板氮化鎵系發光二極體之電雜訊量測及分析研究 Kuan, Chin-I 管金儀 碩士 國立交通大學 電子研究所 100 In this thesis, the device quality of InGaN light-emitting diodes (LEDs) is investigated by studying their low-frequency noise characteristics. We firstly measurethe electrical noisespectra of LEDs under different current injection. Then the individual spectrum isfitted by empirical formula in low-frequency range. Finally the noise exponent is calculated and correlated to the LED quality. The LED samples grown on controlled substrates are intentionally selected for noise characterization, they are: (1) LEDs grown on flat sapphire substrate, patterned sapphire substrate (PSS) and GaN substrate, (2) LEDs grown on first and second wet-etched patterned sapphire substrate, (3) LEDs grown on dry-etched patterned sapphire substrate with different pattern height. Analysis has shown that high quality devices are associated with large noise exponent. Since the extracted noise exponent stand for theratio of noise intensity change to incremental current,high quality LEDs thereforepossesslower noise intensityunder low injected current. By the way, we have confirmed the LED quality by separate material and defect characterization. Lin, Gray Kuo, Hao-Chung 林國瑞 郭浩中 2012 學位論文 ; thesis 85 zh-TW
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language zh-TW
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sources NDLTD
description 碩士 === 國立交通大學 === 電子研究所 === 100 === In this thesis, the device quality of InGaN light-emitting diodes (LEDs) is investigated by studying their low-frequency noise characteristics. We firstly measurethe electrical noisespectra of LEDs under different current injection. Then the individual spectrum isfitted by empirical formula in low-frequency range. Finally the noise exponent is calculated and correlated to the LED quality. The LED samples grown on controlled substrates are intentionally selected for noise characterization, they are: (1) LEDs grown on flat sapphire substrate, patterned sapphire substrate (PSS) and GaN substrate, (2) LEDs grown on first and second wet-etched patterned sapphire substrate, (3) LEDs grown on dry-etched patterned sapphire substrate with different pattern height. Analysis has shown that high quality devices are associated with large noise exponent. Since the extracted noise exponent stand for theratio of noise intensity change to incremental current,high quality LEDs thereforepossesslower noise intensityunder low injected current. By the way, we have confirmed the LED quality by separate material and defect characterization.
author2 Lin, Gray
author_facet Lin, Gray
Kuan, Chin-I
管金儀
author Kuan, Chin-I
管金儀
spellingShingle Kuan, Chin-I
管金儀
Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates
author_sort Kuan, Chin-I
title Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates
title_short Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates
title_full Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates
title_fullStr Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates
title_full_unstemmed Noise Measurement and Analysis of Nitride-Based Light Emitting Diodes Grown on Patterned Sapphire Substrates
title_sort noise measurement and analysis of nitride-based light emitting diodes grown on patterned sapphire substrates
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/93101905775992309531
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