Investigation and Analysis of Drain Current Mismatch and Low Frequency Noise for Nanoscale MOSFETs
博士 === 國立交通大學 === 電子研究所 === 100 === This dissertation investigates and analyzes the drain current mismatch and low frequency noise properties for nanoscale MOSFETs. Through a comparison of the input-referred noise and the trap density of the gate dielectric/semiconductor interface between co-process...
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/38664025478182080568 |