A study on the Classification of Profile Data with Applications in Semiconductor Manufacturing
碩士 === 國立交通大學 === 統計學研究所 === 100 === In the industry, engineers use control charts to monitor process variables for process stability. A point that plots outside of the control limits is interpreted as an evidence that the process is out of control, and investigations and corrective actions are re...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73593503080389768517 |