Comparison of PFCs emission estimation methods and reduction potential from semiconductor industry

碩士 === 國立交通大學 === 工學院永續環境科技學程 === 100 === In recent years, the global climate change caused by the greenhouse gas emission has gained worldwide attention. The CVD and Dry Etch process in semiconductor industry use a significant amount of PFCs (Perfluorinated Carbons) gases. They are high global warm...

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Bibliographic Details
Main Authors: Lin, Chun-Hao, 林俊豪
Other Authors: Bai, Hsunling
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/56554053869823428955

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