The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design

碩士 === 國立中興大學 === 電機工程學系所 === 100 === In recent years, embedded non-volatile memories are used in various systems. However, due to compatibility of processes, memory chips and the other functional chips are fabricated separately. If the memories can be integrated in the same chip with analog and dig...

Full description

Bibliographic Details
Main Authors: ChihYang Huang, 黃智揚
Other Authors: 林泓均
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/28103987955499888564
id ndltd-TW-100NCHU5441080
record_format oai_dc
spelling ndltd-TW-100NCHU54410802017-01-14T04:15:04Z http://ndltd.ncl.edu.tw/handle/28103987955499888564 The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design 完全相容於CMOS製程之嵌入式MTP記憶體與切換電容式降壓器電路設計 ChihYang Huang 黃智揚 碩士 國立中興大學 電機工程學系所 100 In recent years, embedded non-volatile memories are used in various systems. However, due to compatibility of processes, memory chips and the other functional chips are fabricated separately. If the memories can be integrated in the same chip with analog and digital circuits, the single chip is usually referred as SOC (system-on-a-chip). In the mean time, the cost and fabrication time can be reduced. The thesis presents the design of the peripheral circuits for the CMOS-based non-volatile memory cells. The circuits perform program, erase, read and verify for the 8-bit memory array. These include the address decoder, word line driver, bit line driver, source line driver, current sense amplifier, verifying circuit and output stage. Specifically some of these circuits require high-voltage tolerant abilities owing to the operating voltages for program and erase higher than the standard voltage. The peripheral circuit was designed and fabricated. The measurement results show that the memory cells can be programmed and erased within 10 milliseconds and the time of reading for any address is within 11 nanoseconds. Furthermore, the operation of the memory cells needs different bias voltages. Thus, the DC-DC step-down converter was designed. By comparison with low-dropout regulator (LDO), the DC-DC step-down converter employing the switched-capacitor structure can enhance the power efficiency for high voltage conversion ratio which is defined as Vout/Vin, such as 5 V to 1.8 V, 1.2 V and 1 V. The circuit was also designed and fabricated. The measurement results demonstrate the maximum load current is 44 mA with the peak efficiency of 68.6% for 1.8 V output. By switching to the 1.2 V and 1 V modes, the maximum load currents are 79 mA and 78 mA with the peak efficiencies of 67.9% and 54.8%, respectively. 林泓均 2012 學位論文 ; thesis 102 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中興大學 === 電機工程學系所 === 100 === In recent years, embedded non-volatile memories are used in various systems. However, due to compatibility of processes, memory chips and the other functional chips are fabricated separately. If the memories can be integrated in the same chip with analog and digital circuits, the single chip is usually referred as SOC (system-on-a-chip). In the mean time, the cost and fabrication time can be reduced. The thesis presents the design of the peripheral circuits for the CMOS-based non-volatile memory cells. The circuits perform program, erase, read and verify for the 8-bit memory array. These include the address decoder, word line driver, bit line driver, source line driver, current sense amplifier, verifying circuit and output stage. Specifically some of these circuits require high-voltage tolerant abilities owing to the operating voltages for program and erase higher than the standard voltage. The peripheral circuit was designed and fabricated. The measurement results show that the memory cells can be programmed and erased within 10 milliseconds and the time of reading for any address is within 11 nanoseconds. Furthermore, the operation of the memory cells needs different bias voltages. Thus, the DC-DC step-down converter was designed. By comparison with low-dropout regulator (LDO), the DC-DC step-down converter employing the switched-capacitor structure can enhance the power efficiency for high voltage conversion ratio which is defined as Vout/Vin, such as 5 V to 1.8 V, 1.2 V and 1 V. The circuit was also designed and fabricated. The measurement results demonstrate the maximum load current is 44 mA with the peak efficiency of 68.6% for 1.8 V output. By switching to the 1.2 V and 1 V modes, the maximum load currents are 79 mA and 78 mA with the peak efficiencies of 67.9% and 54.8%, respectively.
author2 林泓均
author_facet 林泓均
ChihYang Huang
黃智揚
author ChihYang Huang
黃智揚
spellingShingle ChihYang Huang
黃智揚
The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design
author_sort ChihYang Huang
title The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design
title_short The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design
title_full The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design
title_fullStr The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design
title_full_unstemmed The Fully CMOS Compatible Multiple-Time-Programmable Memory Circuits and Switched-Capacitor DC-DC Converter Design
title_sort fully cmos compatible multiple-time-programmable memory circuits and switched-capacitor dc-dc converter design
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/28103987955499888564
work_keys_str_mv AT chihyanghuang thefullycmoscompatiblemultipletimeprogrammablememorycircuitsandswitchedcapacitordcdcconverterdesign
AT huángzhìyáng thefullycmoscompatiblemultipletimeprogrammablememorycircuitsandswitchedcapacitordcdcconverterdesign
AT chihyanghuang wánquánxiāngróngyúcmoszhìchéngzhīqiànrùshìmtpjìyìtǐyǔqièhuàndiànróngshìjiàngyāqìdiànlùshèjì
AT huángzhìyáng wánquánxiāngróngyúcmoszhìchéngzhīqiànrùshìmtpjìyìtǐyǔqièhuàndiànróngshìjiàngyāqìdiànlùshèjì
AT chihyanghuang fullycmoscompatiblemultipletimeprogrammablememorycircuitsandswitchedcapacitordcdcconverterdesign
AT huángzhìyáng fullycmoscompatiblemultipletimeprogrammablememorycircuitsandswitchedcapacitordcdcconverterdesign
_version_ 1718408035115728896