Design ARM System for Memory Function Test

• Main Authors: Tai, Chun-Tsai, 戴春材
• Other Authors: 蔡 秉 融
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/14229820608594725862

碩士 === 明新科技大學 === 電子工程研究所 === 101 === Taiwan Memory products mainly include DRAM, SRAM, NOR Flash, NAND Flash, Pseudo SRAM, and Mask ROM products. The past few years, memory products primarily used in computers and computer peripheral or gaming. In recent years, the popularity of multimedia applications, high-definition television, digital cameras and smart phones market, driven by market demand for memory, memory products, applications are more widely used. Because every SoC vendor products designed different characteristics, when the CPU and memory operate together, it may occur with the matching compatibility issues, resulting in system memory chip manufacturers and vendors distress. This study uses ARM Cortex-A8 processor test platform for the production, mainly to resolve these compatibility problems with matching, and can quickly test the electrical function of memory, shorten product verification time. In the experimental part of the test results, the experimental test platform SoC vendors can follow to adjust the parameter settings to identify compatibility issues, according to the test results suggest that the system chip manufacturers to modify the software to shorten debug time, allowing customer products to sell as soon as possible.