Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process

碩士 === 義守大學 === 機械與自動化工程學系碩士在職專班 === 100 === The application of the CMOS image sensor has been popular which plays an important role in the video transmission and camera; CIS device is still made with the use of the electronic package technology, where many factors that affect the life of the prod...

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Main Authors: Hsieh, Fengyuan, 謝峰源
Other Authors: Hsu, Hsiangchen
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/01045787486856652231
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spelling ndltd-TW-100ISU006090092015-10-13T21:12:10Z http://ndltd.ncl.edu.tw/handle/01045787486856652231 Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process CIS黏晶製程溫度循環與濕度測試 Hsieh, Fengyuan 謝峰源 碩士 義守大學 機械與自動化工程學系碩士在職專班 100 The application of the CMOS image sensor has been popular which plays an important role in the video transmission and camera; CIS device is still made with the use of the electronic package technology, where many factors that affect the life of the product process and reliability, such as temperature, moisture, stress, pressure. This research study focused on the influence of the three different adhesive glue used in die attach process with temperature cycling test as well as material moisture absorption test of their physical properties, then change with the value of die shear test to verify. Experimental design will combine three kinds of material, such as aluminum substrate, silicon chip, and adhesive glue to assembly. TCT and MSL test have been applied to investigate the effects of CIS through the die shear test values to reflect the structure of the material adhesion in the environment. Based on experimental results, TCT temperature cycling (0℃~100℃, 10 cycle)of Loctite 3549 Epoxy Glue, the specimens obtained through the die shear test data compared that after original bake curing from 54.88kgf decreased to 53.1kgf, die shear force down with 1.78kgf (3.35%), the test conditions for the stress generated by the three materials; follow JEDEC MSL three different Level (30℃,60% RH; 85℃,60% RH; 85℃,85% RH) humidity grade test, for the Epoxy Glue test result of respectively from the original bake curing of 54.88kgf , through the die shear test data compared that decreased to 52.94kgf (3.64%),41.93kgf (24.38%), 33.7kgf (39.88%)。For the Silver Glue die shear test results show the force has been reduced form 47.15kgf to 42.99kgf (8.81%),34.36kgf (27.138%), 28.22kgf (40.15%) for respectively。For the Silicone Glue die shear test result show the force has been reduced form 14.73kgf to 12.79kgf (13.19%),9.33kgf (36.67%), 6.18kgf (58.06%) for respectively。Another optical microscopy experimental result presented the residual area for three different gules after MSL test. It is report the Epoxy Glue glue is the best options for die attach process. Hsu, Hsiangchen Chu, Limin 徐祥禎 朱力民 2012 學位論文 ; thesis 99 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 義守大學 === 機械與自動化工程學系碩士在職專班 === 100 === The application of the CMOS image sensor has been popular which plays an important role in the video transmission and camera; CIS device is still made with the use of the electronic package technology, where many factors that affect the life of the product process and reliability, such as temperature, moisture, stress, pressure. This research study focused on the influence of the three different adhesive glue used in die attach process with temperature cycling test as well as material moisture absorption test of their physical properties, then change with the value of die shear test to verify. Experimental design will combine three kinds of material, such as aluminum substrate, silicon chip, and adhesive glue to assembly. TCT and MSL test have been applied to investigate the effects of CIS through the die shear test values to reflect the structure of the material adhesion in the environment. Based on experimental results, TCT temperature cycling (0℃~100℃, 10 cycle)of Loctite 3549 Epoxy Glue, the specimens obtained through the die shear test data compared that after original bake curing from 54.88kgf decreased to 53.1kgf, die shear force down with 1.78kgf (3.35%), the test conditions for the stress generated by the three materials; follow JEDEC MSL three different Level (30℃,60% RH; 85℃,60% RH; 85℃,85% RH) humidity grade test, for the Epoxy Glue test result of respectively from the original bake curing of 54.88kgf , through the die shear test data compared that decreased to 52.94kgf (3.64%),41.93kgf (24.38%), 33.7kgf (39.88%)。For the Silver Glue die shear test results show the force has been reduced form 47.15kgf to 42.99kgf (8.81%),34.36kgf (27.138%), 28.22kgf (40.15%) for respectively。For the Silicone Glue die shear test result show the force has been reduced form 14.73kgf to 12.79kgf (13.19%),9.33kgf (36.67%), 6.18kgf (58.06%) for respectively。Another optical microscopy experimental result presented the residual area for three different gules after MSL test. It is report the Epoxy Glue glue is the best options for die attach process.
author2 Hsu, Hsiangchen
author_facet Hsu, Hsiangchen
Hsieh, Fengyuan
謝峰源
author Hsieh, Fengyuan
謝峰源
spellingShingle Hsieh, Fengyuan
謝峰源
Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process
author_sort Hsieh, Fengyuan
title Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process
title_short Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process
title_full Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process
title_fullStr Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process
title_full_unstemmed Reliability Analysis Of TCT/MSL Test For CIS Die Attach Process
title_sort reliability analysis of tct/msl test for cis die attach process
publishDate 2012
url http://ndltd.ncl.edu.tw/handle/01045787486856652231
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