Recognition Of The Concurrent Control Chart Patterns On Different Process Noises Using Integrated ICA and SVM Schemes
碩士 === 輔仁大學 === 統計資訊學系應用統計碩士班 === 100 === For industrial processes, the recognition of the control chart patterns (CCPs) have become one of the indispensable monitoring technologies. Most studies assumed that the monitoring process observed value is the single types of unusual patterns. However, in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/66697777403340605046 |