Application of Stochastic Super-Efficiency Data Envelopment Analysis to Quality Problems in Wafer Fabrication Processes
碩士 === 逢甲大學 === 工業工程與系統管理學研究所 === 100 === Recently, Data Envelopment Analysis (DEA) has been widely used. However, the conventional DEA there exist a weakness that doesn''t allow stochastic variations in input and output, such as measure errors, enter errors and process variation...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/23151611945814715577 |