電子光斑干涉術結合應變規鑽孔法之平板面內應力場分析
碩士 === 國立中正大學 === 機械工程學系暨研究所 === 100 === Electronic speckle pattern interferometry (ESPI) and moiré interferometry belong to non-contact measurement techniques. Full-field displacement can be measured by ESPI and moiré interferometry while distribution the conventional hole-drilling strain gage meth...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82398835835212497656 |