Test Data Compression Based on Multi-Meaning Codeword For Alternating Run-Length Codes
碩士 === 元智大學 === 資訊工程學系 === 99 === Due to reduce the test data volumn , test data compression is a common and efficent method. This paper is based on Alternating Run-Length data compression method as the framework to develop a new data compression method to improve the compression ratio. The method...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/60995876886611032100 |
| Summary: | 碩士 === 元智大學 === 資訊工程學系 === 99 === Due to reduce the test data volumn , test data compression is a common and efficent method. This paper is based on Alternating Run-Length data compression method as the framework to develop a new data compression method to improve the compression ratio. The method take the Alternating Run-Length data compression advenntage to improve the test data compression ratio. And our proposed method just use some bits to represent another Run-Length codeword. In other words, our codeword have Multi-Meaning to encode. this method can achieve significant compression ratio. Experimental results for the large ISCAS’89 benchmark circuits have demonstrated the proposed approach can improve the test data compression ratio.
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