Observation of Electromigration-Induced beta-Sn Microstructure Evolution in Real Solder Joints with Various Joint Sizes
碩士 === 元智大學 === 化學工程與材料科學學系 === 99 === White Tin (beta-Sn) has a body-center tetragonal (BCT) (a = b = 5.83 Å; c = 3.18 Å) structure. Due to the anisotropy, the axis has different properties. In this study, we observation of electromigration-induced beta-Sn microstructure evolution in Cu/Sn/Cu dif...
Main Authors: | Chih-Nan Chen, 陳志南 |
---|---|
Other Authors: | Cheng-En Ho |
Format: | Others |
Language: | zh-TW |
Published: |
2011
|
Online Access: | http://ndltd.ncl.edu.tw/handle/78717313765009507150 |
Similar Items
-
Effect of Sn Microstructure on Electromigration in Flip-Chip Solder Joints
by: Chen, Ming-Yao, et al.
Published: (2017) -
Electromigration Reliability of Sn-Ag-Cu Solder Joints Containing Various Ag Contents
by: Bo-Zong Chen, et al.
Published: (2011) -
Effect of Solder Thickness on Electromigration on Sn2.3Ag Solder Joints
by: Khew, Woe-iHaw, et al.
Published: (2012) -
The In-Situ Observation of Grain Rotation and Microstructure Evolution Induced by Electromigration in Sn-3.0Ag-0.5Cu Solder Joints
by: Xing Fu, et al.
Published: (2020-12-01) -
Electromigration in Eutectic Sn-9Zn Lead-Free Solder Joints
by: Shih-Ming Kuo, et al.
Published: (2009)