Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge

碩士 === 元智大學 === 化學工程與材料科學學系 === 99 === This paper uses low pressure plasma polymerization technique to deposit fluorocarbon thin film on three substrates including in silicon wafer, polyethylene terephthalate (PET) and carbon paper. The low-pressure plasma was generated with radio frequency power at...

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Main Authors: Chen-I Lin, 林政毅
Other Authors: 黃駿
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/57801278816790478386
id ndltd-TW-099YZU05063050
record_format oai_dc
spelling ndltd-TW-099YZU050630502016-04-13T04:17:15Z http://ndltd.ncl.edu.tw/handle/57801278816790478386 Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge 利用射頻電容耦合式四氟乙烷電漿沉積疏水薄膜 Chen-I Lin 林政毅 碩士 元智大學 化學工程與材料科學學系 99 This paper uses low pressure plasma polymerization technique to deposit fluorocarbon thin film on three substrates including in silicon wafer, polyethylene terephthalate (PET) and carbon paper. The low-pressure plasma was generated with radio frequency power at 13.56 MHz , and monomer selected for the single bond of 1,1,1,2 tetrafluoroethane (C2H2F4). The investigation studied different operational parameters including in deposition time, RF plasma power level, and system pressure. The surface characteristics of the plasma polymerized films have been analyzed by static contact static angle measurement (CA). In addition, the contact angle results based on Owen method, Advancing and receding angles method revealed that surface free energy would decrease after plasma treatment. The deposited coatings were analyzed by optical thin-film thickness detector, Atomic Force Microscopy (AFM), Fourier Transform Infrared Spectroscopy (FTIR), X-ray Photoelectron Spectroscopy (XPS) and Optical Emission Spectroscopy (OES). The luminous gas phase of plasma state in deposition process was detected by digital camera. The static contact angle of C2H2F4 plasma polymerized film can reach over 150∘. In addition, surface energy of plasma polymerized film decreased to 5 mJ/m2.. According to AFM analysis, the roughness of plasma polymerized films doesn’t change a lot. XPS and FTIR analysis indicate that the C2H2F4 plasma polymerized film mainly contains CF2 and CF species. 黃駿 2011 學位論文 ; thesis 148 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 元智大學 === 化學工程與材料科學學系 === 99 === This paper uses low pressure plasma polymerization technique to deposit fluorocarbon thin film on three substrates including in silicon wafer, polyethylene terephthalate (PET) and carbon paper. The low-pressure plasma was generated with radio frequency power at 13.56 MHz , and monomer selected for the single bond of 1,1,1,2 tetrafluoroethane (C2H2F4). The investigation studied different operational parameters including in deposition time, RF plasma power level, and system pressure. The surface characteristics of the plasma polymerized films have been analyzed by static contact static angle measurement (CA). In addition, the contact angle results based on Owen method, Advancing and receding angles method revealed that surface free energy would decrease after plasma treatment. The deposited coatings were analyzed by optical thin-film thickness detector, Atomic Force Microscopy (AFM), Fourier Transform Infrared Spectroscopy (FTIR), X-ray Photoelectron Spectroscopy (XPS) and Optical Emission Spectroscopy (OES). The luminous gas phase of plasma state in deposition process was detected by digital camera. The static contact angle of C2H2F4 plasma polymerized film can reach over 150∘. In addition, surface energy of plasma polymerized film decreased to 5 mJ/m2.. According to AFM analysis, the roughness of plasma polymerized films doesn’t change a lot. XPS and FTIR analysis indicate that the C2H2F4 plasma polymerized film mainly contains CF2 and CF species.
author2 黃駿
author_facet 黃駿
Chen-I Lin
林政毅
author Chen-I Lin
林政毅
spellingShingle Chen-I Lin
林政毅
Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge
author_sort Chen-I Lin
title Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge
title_short Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge
title_full Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge
title_fullStr Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge
title_full_unstemmed Deposition of Hydrophobic Film with 1,1,1,2-tetrafluoroethane Plasma Based on RF-Capacitively Couple Mode Discharge
title_sort deposition of hydrophobic film with 1,1,1,2-tetrafluoroethane plasma based on rf-capacitively couple mode discharge
publishDate 2011
url http://ndltd.ncl.edu.tw/handle/57801278816790478386
work_keys_str_mv AT chenilin depositionofhydrophobicfilmwith1112tetrafluoroethaneplasmabasedonrfcapacitivelycouplemodedischarge
AT línzhèngyì depositionofhydrophobicfilmwith1112tetrafluoroethaneplasmabasedonrfcapacitivelycouplemodedischarge
AT chenilin lìyòngshèpíndiànróngǒuhéshìsìfúyǐwándiànjiāngchénjīshūshuǐbáomó
AT línzhèngyì lìyòngshèpíndiànróngǒuhéshìsìfúyǐwándiànjiāngchénjīshūshuǐbáomó
_version_ 1718222455793778688