Evaluation and Selection of Processes Based on Yield Index

• Main Authors: Hsin-Hui Kuo, 郭馨蕙
• Other Authors: 林真如
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/02687454118166140505

碩士 === 元智大學 === 工業工程與管理學系 === 99 === The quality of products is closely related to production procedures. The selection of multiple manufacturing processes is a common problem from the very beginning of supplier selection to the selection of different manufacturing parameters. Among different criteria for process evaluation, production yield is one of the key requirements. The yield rates are extremely high with small differences nowadays that make it difficult to determine the best production lines. The Spk yield index is an effective tool for yield evaluation under high quality. However, previous literatures do not develop the multiple comparison methods for comparing a group of Spk’s. The conventional multiple comparisons techniques for evaluating different means cannot be directly applied to evaluate yield indices. Thus, this paper proposes a multiple comparisons with the best (MCB) method based on the yield index Spk. With the established confidence intervals of the difference between every yield index and the highest one, the best production line with the highest yield can be effectively identified. Comparing to the all-pairwise comparisons, the results show that the proposed method can easily conclude the best production line.