A Research using QFD model for the Quality Control Evaluation of R&D Software Development System in Semiconductor Manufacturing
碩士 === 元培科技大學 === 企業管理研究所 === 99 === With the rapid progress on wafer fabrication technology, the width of IC is shortened from micron-scaled level to nano-scaled level, and the device density of IC is more and more large. As wafer fabrication technology upgrades to a higher precision level, the sem...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/34a753 |