none

碩士 === 東吳大學 === 經濟學系 === 99 === This article studies the operational risk for electronics industry. There are 486 listed electronic companies in sample. The study uses Top-Down model to estimate the value of operational risk for each company. We then test whether the value of operational risk is gre...

Full description

Bibliographic Details
Main Authors: Yung-hsiang Hsu, 許詠翔
Other Authors: none
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/84273242382035370007
id ndltd-TW-099SCU05389025
record_format oai_dc
spelling ndltd-TW-099SCU053890252016-04-11T04:22:59Z http://ndltd.ncl.edu.tw/handle/84273242382035370007 none 電子業作業風險之研究-Top-Down方法 Yung-hsiang Hsu 許詠翔 碩士 東吳大學 經濟學系 99 This article studies the operational risk for electronics industry. There are 486 listed electronic companies in sample. The study uses Top-Down model to estimate the value of operational risk for each company. We then test whether the value of operational risk is greater in crises.We also want to see the predictive power of operational risk for company's financial crisis. The empirical results show that: (1) Operational risk value is significantly higher in crisis for all samples, semiconductor industry, computer and peripherals industry, and the electronic components industry. (2) In Panel Data Logit model, the increase of profitability and liquidity will significantly decrease while the increase of interest rates will significantly increase the probability of crisis for electronics industry. In Panel Data Multinomial Logit model, the increase of profitability and liquidity will significantly decrease while the increase of insecurity and interest rates will significantly increase the probability of lawsuits for the electronics industry. The increase of profitability and liquidity will significantly decrease while the increase of Interest rates will significantly increase the probability of other events. (3) In all models, the increase of profitability and the decrease of interest rate will decrease the probability of crisis for electronics industry. The increase of operational risk will increase the probability of crisis though the effect is insignificant. none 陳碧綉 2011 學位論文 ; thesis 52 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 東吳大學 === 經濟學系 === 99 === This article studies the operational risk for electronics industry. There are 486 listed electronic companies in sample. The study uses Top-Down model to estimate the value of operational risk for each company. We then test whether the value of operational risk is greater in crises.We also want to see the predictive power of operational risk for company's financial crisis. The empirical results show that: (1) Operational risk value is significantly higher in crisis for all samples, semiconductor industry, computer and peripherals industry, and the electronic components industry. (2) In Panel Data Logit model, the increase of profitability and liquidity will significantly decrease while the increase of interest rates will significantly increase the probability of crisis for electronics industry. In Panel Data Multinomial Logit model, the increase of profitability and liquidity will significantly decrease while the increase of insecurity and interest rates will significantly increase the probability of lawsuits for the electronics industry. The increase of profitability and liquidity will significantly decrease while the increase of Interest rates will significantly increase the probability of other events. (3) In all models, the increase of profitability and the decrease of interest rate will decrease the probability of crisis for electronics industry. The increase of operational risk will increase the probability of crisis though the effect is insignificant.
author2 none
author_facet none
Yung-hsiang Hsu
許詠翔
author Yung-hsiang Hsu
許詠翔
spellingShingle Yung-hsiang Hsu
許詠翔
none
author_sort Yung-hsiang Hsu
title none
title_short none
title_full none
title_fullStr none
title_full_unstemmed none
title_sort none
publishDate 2011
url http://ndltd.ncl.edu.tw/handle/84273242382035370007
work_keys_str_mv AT yunghsianghsu none
AT xǔyǒngxiáng none
AT yunghsianghsu diànziyèzuòyèfēngxiǎnzhīyánjiūtopdownfāngfǎ
AT xǔyǒngxiáng diànziyèzuòyèfēngxiǎnzhīyánjiūtopdownfāngfǎ
_version_ 1718221849337266176