| Summary: | 碩士 === 國立臺灣科技大學 === 電子工程系 === 99 === This paper provides a TDC based on pulse stretch method possesses self calibration technique. The pulse stretcher is implemented by dual-slope method. The self calibration technique uses Successive-Approximation Register (SAR) to reduce the error from process, supply voltage and ambient temperature (PVT) variation. Therefore, the precision and accuracy have low sensitivity of PVT variation.
The resolution of proposed TDC reaches 3.9ps. Die area is 0.77×0.25 mm2. The power consumption is 15.4mW. The process is TSMC 1P6M 0.18μm. According to the simulation result, under process variation, supply voltage variation over 1.62V to 1.98V and ambient temperature variation over 0℃ to 100℃, the stretch factor tallies the requirement of anticipated specification.
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