Chromatic Wide-range Microscopy for Full-Field Micro Surface Measurement
碩士 === 國立臺灣大學 === 機械工程學研究所 === 99 === With improvement of fabrication precision and increasing miniaturization of structure, measuring technology has become an important part in industry. non-contact measurement technology is more flexible than contact one, so it has been a trend for developing m...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/17755117289277342747 |