Reliability Assessment of Electronic Devices Based on a High-Degree-of-Freedom Acceleration Model
碩士 === 國立臺灣大學 === 機械工程學研究所 === 99 === In order to understand the reliability characteristics of electronic device, such as electronic connector, researchers often use accelerated life test to obtain the life of products, and then analyze and assess the reliability of products. In this study, to un...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/71649262888111585143 |