Reliability Assessment of Electronic Connectors Based on Multiple-Stress Accelerated Life Test
碩士 === 國立臺灣大學 === 機械工程學研究所 === 99 === To understand the failure mode and the characteristics of life distribution of system or components of electronic products in a short time, accelerated test has become an important test in industry. Temperature, humidity, electricity voltage or the processin...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/55971222080694002813 |