Apply Computational Intelligence to Automatic Post-sawing LED Wafer Defect Inspection
博士 === 國立臺灣海洋大學 === 電機工程學系 === 99 === Light-emitting diodes (LEDs) have become increasingly used in the electronics industry. In addition to increasing wafer dimensions, the yield ratio can be improved to increase revenue. To increase yield, defect inspection before die encapsulation is commonly use...
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33193655331775129793 |