可修補的三維晶片設計與修補方法
博士 === 國立清華大學 === 電機工程學系 === 99 === In view of the challenges encountered by CMOS scaling, it seems inevitable that a highly integrated system on chip (SOC) must start from low production yield, and then it takes tremendous time and effort to improve the yield to a reasonably high level. Three-dimen...
Main Authors: | Chou, Yung-Fa, 周永發 |
---|---|
Other Authors: | Wu, Cheng-Wen |
Format: | Others |
Language: | en_US |
Published: |
2011
|
Online Access: | http://ndltd.ncl.edu.tw/handle/10213278359772366387 |
Similar Items
-
304不鏽鋼的疲勞裂縫修補
by: Huang, Guo Zheng, et al.
Published: (1995) -
漢語失語症病患的自我修補模式
by: 廖儷雲, et al. -
圓軸疲勞裂縫修補
by: Cheng. Chen-Hsing, et al.
Published: (2000) -
圓孔邊緣裂縫的黏著修補分析
by: ZHANG, YAO-HAO, et al.
Published: (1992) -
三維晶片時脈樹的容錯設計
by: Huang, Shih-Hsiu, et al.
Published: (2011)