Low-Frequency Noise Characterization of Advanced Metal-Oxide-Semiconductor Field-Effect-Transistors

Low-Frequency Noise Characterization of Advanced Metal-Oxide-Semiconductor Field-Effect-Transistors

博士 === 國立清華大學 === 電子工程研究所 === 99

Bibliographic Details
Main Authors:	Chen, Yu-Ting, 陳育廷
Other Authors:	葉鳳生
Format:	Others
Language:	en_US
Published:	2011
Online Access:	http://ndltd.ncl.edu.tw/handle/78427439770008088723

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