Effects of Dielectric-Surface Functionalization on the Growth of Rubrene Thin Films and Their Transistor Performance
碩士 === 國立清華大學 === 化學系 === 99 === We investigated the effects of functionalization of dielectric surface on the growth of rubrene thin films by optical microscopy, atomic force microscopy (AFM), near-edge x-ray absorption fine structure (NEXAFS), and x-ray diffraction (XRD) techniques. We used self-a...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/87934866487999341891 |