A study of the ZrO2/NiO interfaces

• Main Authors: Jiun-Yang Chen, 陳俊揚
• Other Authors: Der-Shin Gan
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/22302927427503274450

碩士 === 國立中山大學 === 材料與光電科學學系研究所 === 99 === The stable interfaces between NiO and ZrO2 reached by nanofilms interface rotation method are reported in this study. Epitaxial nanofilms of NiO and ZrO2 were synthesized on single crystal NaCl (001), (011), (111) surfaces. All nanofilms are investigated by transmission electron microscopy and selected-area diffraction (SAD) patterns. Composite nanofilms were formed by overlapping nanofilms of NiO and ZrO2 at difference angles and thermally treated. The rotation process and final stable interfaces in the overlapped nanofilms are analyzed by SAD patterns. Orientation relationships and interface rotation are analyzed. This study found five new interfaces. (1) (001)N/ Z，[110]N//[110]Z (2) (001)N/ Z，[100]N//[110]Z (3) N/ Z，[110]N//[110]Z (4) N/ Z，[111]N//[110]Z (5) N/ Z，[001]N//[110]Z