The Present and Future of U.S. Patent Post-Grant Administrative Revocation Mechanism--Focusing on Reexamination and Post-Grant Review
碩士 === 國立交通大學 === 科技法律研究所 === 99 === Reexamination is an administrative revocation mechanism which is designed to ensure validity of granted patents in the United States for improving the quality of the patent system. Since such mechanism focuses only on patents with market value, which sa...
Main Authors: | Lai, Po-Han, 賴柏翰 |
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Other Authors: | Wang, Li-Dar |
Format: | Others |
Language: | zh-TW |
Published: |
2011
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Online Access: | http://ndltd.ncl.edu.tw/handle/22742173884216797930 |
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