Structural characterization of non-polar ZnO thin films on LaAlO3
博士 === 國立交通大學 === 材料科學與工程學系 === 99 === The structural properties of various non-polar ZnO thin films have been systematically characterized in detail by using electron microscopy. The structural properties include crystallography relationships, interfaces, crystal defects, and growth mechanism. Non-...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/15900522556381547089 |