Metric-Learning Face Verification Using Local Binary Pattern

• Main Authors: Pei-HsunWu, 吳沛勳
• Other Authors: Jenn-Jier James Lien
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/49593027304201220818

碩士 === 國立成功大學 === 資訊工程學系碩博士班 === 99