Performance assessment of produce traceability using RFID system in semiconductor IC-assembly house

碩士 === 國立勤益科技大學 === 工業工程與管理系 === 99 === IC industry with the rapid development of science and technology, and product diversification, and reduce the life cycle. Operators generate more pressure to control the quality and quantity of materials. Written record of accuracy and precision in production...

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Bibliographic Details
Main Authors: Ya-Jun Liu, 劉雅君
Other Authors: Wei-Ling Wang
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/67111694702239135125