A Wearout Early Predication Method by Using MACD Technique
碩士 === 國立中興大學 === 資訊科學與工程學系所 === 99 === In recent years, due to the prosperous development of the semiconductor industry, the reliability of CMOS has became an important research issue. The size of the integrated circuit is made smaller, so the Gate Oxide of CMOS also needs to be diminished and b...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96452167784628562714 |